Test Systems Reports

Rapid Bottleneck Identification - A Better Way to do Load Testing
sponsored by Oracle Corporation
WHITE PAPER: Rapid bottleneck identification (RBI) is a new testing methodology that allows quality assurance (QA) professionals to very quickly uncover Web application performance limitations and determine the impact of those limitations on the end user experience.
Posted: 12 Oct 2009 | Published: 01 Jun 2009

Oracle Corporation

Applying Updates for Dell PowerEdge Servers Using Microsoft Systems Management Server 2003 Part 2
sponsored by DellEMC and Intel®
WHITE PAPER: Managing hardware updates is a key aspect of the MS Systems Management Server (SMS) 2003 with the introduction of the SMS 2003 Inventory Tool for Dell Update. This article provides guidelines for the process and is the final segment of a two part series.
Posted: 27 Jul 2006 | Published: 01 Jul 2006

DellEMC and Intel®

Solitaire Interglobal: Comparing Virtualization Methods for Business - Executive Summary
sponsored by IBM.
WHITE PAPER: Access this resource for a deep dive analysis of the business differentiators among x86, UNIX, and System z virtualization technologies to help you determine the right path for your data center.
Posted: 21 May 2013 | Published: 22 May 2012

IBM.

Faster Application Development via Improved Database Change Management
sponsored by Embarcadero Technologies, Inc.
WHITE PAPER: Embarcadero® Change Manager™ puts the power of change tracking, schema comparison, software-generated synchronization scripts, and flexible reporting into the hands of the development team.
Posted: 01 Apr 2009 | Published: 27 Mar 2009

Embarcadero Technologies, Inc.

NI TestStand 3.0 - Developing Automated Test Systems Faster and Smarter
sponsored by National Instruments
WHITE PAPER: Learn how TestStand 3.0 delivers continued innovation as the leading test management software among electronics manufacturers for automated prototype, validation, and manufacturing test systems.
Posted: 28 Aug 2003 | Published: 01 Jul 2003

National Instruments

Intel® Itanium® Processor 9100 Series
sponsored by Intel Corporation
PRODUCT OVERVIEW: The Intel Itanium processor 9100 series is delivering new levels of flexibility, reliability, performance and scalability for mission-critical and data-intensive applications. Read this report to learn more.
Posted: 03 Dec 2007 | Published: 01 Oct 2007

Intel Corporation

Applying Updates for Dell PowerEdge Servers Using Microsoft Systems Management Server 2003 Part 1
sponsored by DellEMC and Intel®
WHITE PAPER: Managing hardware updates is a key aspect of the MS Systems Management Server (SMS) 2003 with the introduction of the SMS 2003 Inventory Tool for Dell Update. This article provides guidelines for the process and is the first segment of a two part series.
Posted: 27 Jul 2006 | Published: 01 Jul 2006

DellEMC and Intel®

Softbank Mobile Overhauls its System Testing and Transforms Delivery of New Products
sponsored by Hewlett Packard Enterprise
CASE STUDY: Check out this brief case study to see how Softbank Mobile Corporation, one of Japan's leading mobile telecommunications providers, implemented a new system test standardization to ensure top-notch quality of all their business-critical applications and systems, at a fast pace and low cost.
Posted: 25 Jun 2013 | Published: 30 Sep 2012

Hewlett Packard Enterprise

RMIT University delivers a positive student experience with HP
sponsored by Hewlett Packard Enterprise
CASE STUDY: RMIT University, one of Australia's leading educational institutions, was struggling with a poor-performing student portal and website. In this brief case study, find out how RMIT implemented a performance testing platform to predict future system behavior, improve application performance, and optimize future student-critical app delivery.
Posted: 24 Jun 2013 | Published: 31 Aug 2011

Hewlett Packard Enterprise

National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test
sponsored by National Instruments
WHITE PAPER: By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side.
Posted: 28 Aug 2003 | Published: 01 Jul 2003

National Instruments